Image defect identification
US11030738B2 · kind B2 · utility
4Cited by
4References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 5, 2019 |
| Grant date | Jun 8, 2021 |
| Priority date | — |
| Expiry date | Aug 27, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/06
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method, a device and a computer program product for image processing are proposed. In the method, whether a first image indicates a defect associated with a target object is determined. In response to determining that the first image indicates the defect, a second image absent from the defect is obtained based on the first image. The defect is identified by comparing the first image with the second image. In this way, the defect associated with the target object in the image can be accurately and efficiently identified or segmented.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.