Patent · US Active

Mass spectrometer and mass spectrometry

US11031226B2 · kind B2 · utility

0Cited by
1References
5Claims
0Family size

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Key dates

Filing dateOct 25, 2017
Grant dateJun 8, 2021
Priority date
Expiry dateOct 25, 2037

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J49/4215
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Provided is a mass spectrometric method including steps of transporting ions generated in an ion source 2 to a mass spectrometer section 4 through an ion optical system 3 having a plurality of ion lenses 31, 32 and 33, and detecting the ions after performing mass separation of the ions. The method further includes steps of: adjusting a voltage applied to a first ion lens 33 which is one of the ion lenses 31, 32 and 33 so that the detection sensitivity for an ion having a predetermined mass-to-charge ratio satisfies a previously specified requirement; and applying, to a second ion lens 32 which is one of the ion lenses 31, 32 and 33 except the first ion lens 33, a voltage at which a change in the ion detection sensitivity with respect to the voltage applied to the second ion lens 33 is within a previously specified range.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.