Surface defect detection system and method thereof
US11035802B2 · kind B2 · utility
2Cited by
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9Claims
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Key dates
| Filing date | May 13, 2019 |
| Grant date | Jun 15, 2021 |
| Priority date | — |
| Expiry date | Nov 11, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20084
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A surface defect detection method applied to a surface of an object is disclosed. The method includes obtaining an image of the surface, performing a deep learning algorithm by a computing device to set a plurality of bounding boxes in the image and to output a plurality of feature parameter sets associated with the plurality of bounding boxes, with each bounding box enclosing a possible defect of the surface, and performing a classifying algorithm by the computing device according to the bounding boxes and the feature parameters to determine whether the surface conforms to a specification.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.