Methods of obtaining error correction for reflection coefficient measurement systems
US11035949B2 · kind B2 · utility
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5References
10Claims
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Key dates
| Filing date | Apr 10, 2018 |
| Grant date | Jun 15, 2021 |
| Priority date | — |
| Expiry date | Feb 10, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S13/0209
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present disclosure is directed to a measurement system for measuring a reflection coefficient of a test sample, including: a transceiver antenna configured to be coupled to a source of electromagnetic radiation; and a RAM positioned between the transceiver antenna and a measurement region of the transceiver antenna, wherein the RAM comprises an aperture substantially orthogonal to and substantially aligned with a transceiving axis of the transceiver antenna. A method for obtaining error correction of a measurement system and a method of measuring a reflection coefficient in a test sample are also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.