Testing resistance of a circuit to a side channel analysis
US11036891B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 20, 2018 |
| Grant date | Jun 15, 2021 |
| Priority date | — |
| Expiry date | Mar 4, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L2209/12
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In a general aspect, a test method can include: acquiring a plurality of value sets, each comprising values of a physical quantity or of logic signals, linked to the activity of a circuit to be tested when executing distinct cryptographic operations applied to a same secret data, for each value set, counting occurrence numbers of the values of the set, for each operation and each of the possible values of a part of the secret data, computing a partial result of operation, computing sums of occurrence numbers, each sum being obtained by adding the occurrence numbers corresponding to the operations which when applied to a same possible value of the part of the secret data, provide a partial operation result having a same value, and analyzing the sums of occurrence numbers to determine the part of the secret data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.