Method and apparatus for pattern recognition
US11036968B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 28, 2018 |
| Grant date | Jun 15, 2021 |
| Priority date | — |
| Expiry date | Nov 10, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V40/172
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and an apparatus for pattern recognition is provided in the present invention, applied to the field of artificial intelligence. The method includes: acquiring a two-dimensional image of a target object and a two-dimensional feature of the target object according to the two-dimensional image of the target object; and acquiring a three-dimensional image of the target object and a three-dimensional feature of the target object according to the three-dimensional image of the target object; identifying the target object according to the two-dimensional feature and the three-dimensional feature of the target object. The method can reduce restrictions on acquiring the image of the target object, for example, reduce the restrictions on the image of the target object in terms of postures, lighting, expressions, make-up and occlusion, thereby improving an accuracy of recognizing the target object and improving a recognition rate and reducing recognition time at the same time.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.