Apparatus and method for analog-to-digital conversion
US11038516B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | May 29, 2020 |
| Grant date | Jun 15, 2021 |
| Priority date | — |
| Expiry date | May 29, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/1215
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
An apparatus and method for analog-to-digital conversion. The apparatus includes a first analog-to-digital converter (ADC), a second ADC, and a calibration unit. The first ADC is configured to sample an input analog signal at a first sampling frequency. The second ADC is configured to sample the input analog signal at a second sampling frequency. The second sampling frequency is a fraction of the first sampling frequency. The calibration unit is configured to correct a distortion incurred in an output of the first ADC based on an output of the second ADC. The first ADC may be a time-interleaved ADC. The second ADC may be an extra sub-ADC of the time-interleaved ADC. The second ADC may be configured to sample the input analog signal at random sampling phases. A dithering noise may be added to the input analog signal of the second ADC. The calibration unit may be a non-linear equalizer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.