Standoff trace chemical detection with active infrared spectroscopy
US11041754B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 15, 2020 |
| Grant date | Jun 22, 2021 |
| Priority date | — |
| Expiry date | Apr 15, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02F1/3528
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and process scans a target area at a distance of 3-30 m for one or more materials. Scanning is performed by a coherent transmit beam aimed with the help of a thermal camera. The active source of the beam is a supercontinuum (SC) laser. The transmitted source beam is modulated by a high-speed Fourier-transform spectrometer prior to interaction with the target. Target reflected source beam is detected by an infrared detector, along with a reference portion of the transmitted source beam, as a series of interferograms; passed through a digitizer for digitizing the interferograms; and processed to producing spectrograms, wherein the spectrograms are indicative of one or more materials on the target.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.