Patent · US Active

Test element analysis system for the analytical examination of a sample

US11041846B2 · kind B2 · utility

0Cited by
2References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 21, 2018
Grant dateJun 22, 2021
Priority date
Expiry dateApr 30, 2039

Classification

  • Technology area (CPC A)Human Necessities
  • CPC primaryA61B5/145
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A test element analysis system for the analytical examination of a sample is disclosed. The test element analysis system comprises: at least one evaluation device with at least one test element holder for positioning a test element containing the sample and at least one measuring device for measuring a change in a measuring zone of the test element, the change being characteristic for the analyte; at least one electrical heating element configured for electrically heating the test element; at least one electrical power supply for supplying electrical energy to the electrical heating element; at least one temperature sensor connected to the test element holder for detecting a temperature of the test element holder; at least one gap detection device configured for monitoring the electrical energy Espez supplied by the electrical power supply to the electrical heating element for reaching a predetermined target temperature measured by the temperature sensor.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.