Methods and devices for detecting open and/or shorts circuits in MEMS micro-mirror devices
US11042024B2 · kind B2 · utility
0Cited by
3References
15Claims
0Family size
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Key dates
| Filing date | Mar 8, 2019 |
| Grant date | Jun 22, 2021 |
| Priority date | — |
| Expiry date | Aug 18, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2330/12
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
According to the present invention there is provided methods and devices for detecting open and/or short circuits in MEMS micro-mirror devices, which use relative comparisons of voltage levels within the MEMS micro-mirror devices for detecting the occurrence of open and/or short circuits.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.