IC test information management system based on industrial internet
US11042680B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 25, 2019 |
| Grant date | Jun 22, 2021 |
| Priority date | — |
| Expiry date | Jul 25, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06Q10/107
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present invention discloses an information management method and system for IC tests, and a storage medium. The method comprises steps of: providing test data generated by performing an IC test by an IC test platform, the IC test platform being an IC test platform having more than one stage, each stage of the IC test platform comprising a plurality of test devices: providing resource data related to the IC test, other than the test data; and analyzing the IC test according to the test data of the IC test and the resource data, to obtain result data related to the IC test. In this way, the present invention can provide technical support for utilizing the value of test data generated in IC tests.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.