Seed analysis
US11044843B2 · kind B2 · utility
9Cited by
0References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 8, 2019 |
| Grant date | Jun 29, 2021 |
| Priority date | — |
| Expiry date | May 26, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30188
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of analyzing seeds including acquiring, using an X-ray machine, X-ray images of the seeds. Analyzing the X-ray images to determine a parameter of each of the seeds. Comparing a parameter determined from analyzing the X-ray image of one seed to a parameter determined from analyzing the X-ray image of another seed. Arranging the seeds relative to each other based on the seed parameters.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.