Method for evaluating the quality of the measurement of a wavefront and systems implementing such a method
US11047741B2 · kind B2 · utility
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2References
15Claims
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Key dates
| Filing date | Jan 26, 2018 |
| Grant date | Jun 29, 2021 |
| Priority date | — |
| Expiry date | Jan 26, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2009/028
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for evaluating the quality of the measurement of an optical wavefront, said measurement being obtained by means of a wavefront analyzer by direct measurement, the method comprising:
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.