Patent · US Active

Measuring system and method

US11047881B2 · kind B2 · utility

2Cited by
7References
19Claims
0Family size

Inventors

Key dates

Filing dateJan 15, 2018
Grant dateJun 29, 2021
Priority date
Expiry dateSep 9, 2038

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F2213/0012
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A measuring system for measuring signals with multiple measurement probes comprises a multi probe measurement device comprising at least two probe interfaces that each couple the multi probe measurement device with at least one of the measurement probes, a data interface that couples the multi probe measurement device to a measurement data receiver, and a processing unit coupled to the at least two probe interfaces that records measurement values via the at least two probe interfaces from the measurement probes, wherein the processing unit is further coupled to the data interface and provides the recorded measurement values to the measurement data receiver, and a measurement data receiver comprising a data interface, wherein the data interface of the measurement data receiver is coupled to the data interface of the multi probe measurement device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.