Patent · US Active

Minimizing phase mismatch and offset sensitivity in a dual-path system

US11047890B2 · kind B2 · utility

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15Claims
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Key dates

Filing dateSep 4, 2018
Grant dateJun 29, 2021
Priority date
Expiry dateJun 26, 2039

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03G2201/103
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of determining a phase misalignment between a first signal generated from a first signal path and a second signal generated from a second signal path may include obtaining multiple samples of the first signal proximate to when the first signal crosses zero wherein the first signal can be approximated as linear; obtaining multiple samples of the second signal proximate to when the second signal crosses zero wherein the first signal can be approximated as linear; based on the multiple samples of the first signal, approximating a first time at which the first signal crosses zero; based on the multiple samples of the second signal, approximating a second time at which the second signal crosses zero; and determining the phase misalignment between the first signal and the second signal based on a difference between the first time and the second time.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.