Determining composition of metal artifacts using dynamic electromagnetic profile measurements
US11047932B2 · kind B2 · utility
Inventor
Key dates
| Filing date | Mar 13, 2020 |
| Grant date | Jun 29, 2021 |
| Priority date | — |
| Expiry date | Mar 13, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/12
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus determines the composition of a metal artifact. The apparatus includes an electrical current source, a metal artifact to be tested, two electrical cables, and a first electrical cable and a second electrical cable different from the first electrical cable. Each of the first electrical cable and the second electrical cable is connected between the electrical current source and the metal artifact. During a test, the electrical current source outputs current. When the electrical current source outputs the current, the current travel through at least a portion of the metal artifact. The apparatus further includes a magnetic field sensor that detects, during the test, a magnetic field generated by the metal artifact when the current travels through the at least the portion of the metal artifact. The magnetic field sensor is disposed within a predetermined distance of the metal artifact during the test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.