Patent · US Active

Methods for laser processing transparent workpieces using pulsed laser beam focal lines and vapor etching

US11052481B2 · kind B2 · utility

0Cited by
5References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 29, 2020
Grant dateJul 6, 2021
Priority date
Expiry dateJan 29, 2040

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB23K26/362
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A method for processing a transparent workpiece includes directing a pulsed laser beam into the transparent workpiece such that a portion of the pulsed laser beam directed into the transparent workpiece generates an induced absorption within the transparent workpiece, thereby forming a damage line within the transparent workpiece, and the portion of the pulsed laser beam directed into the transparent workpiece includes a wavelength λ, a spot size w0, and a Rayleigh range ZR that is greater than where FD is a dimensionless divergence factor comprising a value of 10 or greater. Further, the method for processing the transparent workpiece includes etching the transparent workpiece with an etching vapor to remove at least a portion of the transparent workpiece along the damage line, thereby forming an aperture extending through the at least a portion of the thickness of the transparent workpiece.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.