System and method for controlling the impact of process and temperature in passive signal detector for automotive ethernet
US11054447B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 6, 2019 |
| Grant date | Jul 6, 2021 |
| Priority date | — |
| Expiry date | Oct 18, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L2012/40273
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for controlling the impact of process and temperature in passive signal detector includes a voltage level detector, a first transistor with a drain electrically connected to a first input of the voltage level detector, and a second transistor with a drain electrically connected to a second input of the voltage level detector. The first transistor has a threshold voltage of a first voltage value. The threshold voltage corresponds to a minimum gate-to-source voltage to create a conducting path between source and drain terminals of a transistor. The second transistor has a threshold voltage of the first voltage value. An offset voltage is applied across a gate of the first transistor and a source of the second transistor, and applied across a gate of the second transistor and a source of the first transistor. A difference between a threshold voltage and the offset voltage is constant.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.