Feature index-based feature detection
US11054537B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | Jan 26, 2017 |
| Grant date | Jul 6, 2021 |
| Priority date | — |
| Expiry date | Oct 8, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V2210/646
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method can include receiving n-dimensional data where n is equal at least three; analyzing a plurality of two-dimensional slices of the n-dimensional data to determine characteristic information with respect to a plurality of feature indexes for a feature in the n-dimensional data; and, based at least in part on the characteristic information, associating the feature with one of the feature indexes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.