Method of examining reliability of a gate driver on array (GOA) circuit and system thereof
US11054677B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Feb 12, 2018 |
| Grant date | Jul 6, 2021 |
| Priority date | — |
| Expiry date | Jul 6, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2330/00
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method of examining reliability of a gate driver on array (GOA) circuit and a system thereof are provided. The method includes matching a liquid crystal panel with a direct-lit backlight/an edge-lit backlight to form a liquid crystal display module; disposing a heater on a position of the liquid crystal panel upper surface corresponding to a GOA circuit region; implementing a reliability test to the liquid crystal display module, wherein the heater heats the liquid crystal panel to a predetermined temperature; and observing a screen situation of the liquid crystal panel to examine an effect of temperature on the reliability of the GOA circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.