Patent · US Active

Method and apparatus for analyzing an image

US11055580B2 · kind B2 · utility

1Cited by

2References

11Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventors

Peter Amon · Birkenfeld, DE
Andreas Hutter · Munich, DE
Sanjukta Ghosh · Röthenbach an der Pegnitz, DE

Key dates

Filing date	Jun 4, 2018
Grant date	Jul 6, 2021
Priority date	—
Expiry date	Jun 4, 2038

Classification

Technology area (CPC G)Physics
CPC primaryG06V20/56
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

The disclosure relates to a method and an apparatus for analyzing an image using a deep neural net pre-trained for multiple classes. The image is processed by a forward pass through an adapted neural net to generate a processing result. The adapted neural net is adapted from the pre-trained neural net to focus on exactly one selected class. The processing result is then analyzed focused on features corresponding to the selected class using an image processing algorithm. A modified image is generated by removing a manifestation of these features from the image.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.