Metal oxide interface passivation for photon counting devices
US11056527B2 · kind B2 · utility
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11References
16Claims
0Family size
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Key dates
| Filing date | May 4, 2016 |
| Grant date | Jul 6, 2021 |
| Priority date | — |
| Expiry date | Aug 20, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10F77/306
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
Described herein are photon counting devices comprising direct mode detectors with improved signal to noise ratios which are suitable for use in X-ray imaging devices, and other imaging devices.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.