Edge feature measurement
US11060844B2 · kind B2 · utility
0Cited by
6References
22Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 24, 2015 |
| Grant date | Jul 13, 2021 |
| Priority date | — |
| Expiry date | Jun 13, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N23/57
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An apparatus for measuring edge features of a work piece includes an optical sensor assembly and a reference device. The reference device includes a contact surface configured to contact a surface of the work piece adjacent to an edge of the work piece and a marked surface including a plurality of markings indicating positions relative to the contact surface. The reference device is configured to be coupled to a portion of the optical sensor assembly such that the optical sensor assembly is positioned to capture an image representing a portion of the marked surface and an edge feature of the work piece.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.