Calibration system for attenuated total reflection spectrometry
US11060914B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 30, 2018 |
| Grant date | Jul 13, 2021 |
| Priority date | — |
| Expiry date | Mar 22, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/2879
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An ATR scanner and method for calibrating the same are disclosed. The scanner includes an ATR objective having a reflecting face and an optical port adapted to receive a first light beam, and to focus the first light beam to a point, at a location on the reflecting face such that the first light beam is reflected by the reflecting face and no portion of the first light beam strikes the reflecting face at an angle greater than the critical angle. A detector measures an intensity of light reflected from the reflecting face. A controller controls the location of the focal point and determines an intensity of light that was incident on the reflecting face as a function of the position on the reflecting face and an intensity of light that was reflected from the reflecting face as a function of position on the reflecting face.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.