Patent · US Active

Resist composition, method of forming resist pattern, polymeric compound, and compound

US11061329B2 · kind B2 · utility

1Cited by
0References
4Claims
0Family size

Assignee

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Key dates

Filing dateOct 29, 2018
Grant dateJul 13, 2021
Priority date
Expiry dateMar 19, 2039

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC08L67/04
  • WIPO fieldMacromolecular chemistry, polymers
  • WIPO sectorChemistry

Abstract

A resist composition including a resin component having a structural unit derived form a compound represented by formula (a0-1) (in the formula, W represents a polymerizable group-containing group; Ra01 is a group which is bonded to Ra03 to form an aliphatic cyclic group, or bonded to Ra04 to form an aliphatic cyclic group;Ra02 represents a hydrocarbon group which may have a substituent; Ra03 is a hydrogen atom or a monovalent organic group in the case where Ra01 is not bonded thereto; Ra04 is a hydrogen atom or a monovalent organic group in the case where Ra01 is not bonded thereto; and Ra05 to Ra07 each independently represents a hydrogen atom or a monovalent organic group).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.