Patent · US Active

Method for gauging surfaces with classification of measurements as valid or non-valid

US11067390B2 · kind B2 · utility

0Cited by

2References

15Claims

0Family size

Assignee

HEXAGON TECHNOLOGY CENTER GMBH · CH

Inventors

Frank Przygodda · Villingen-Schwenningen, DE
Thomas Jensen · Rorschach, CH

Key dates

Filing date	Feb 6, 2020
Grant date	Jul 20, 2021
Priority date	—
Expiry date	Feb 6, 2040

Classification

Technology area (CPC G)Physics
CPC primaryG01B9/02091
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for measurement of a surface, in particular according to the principle of Optical Coherence Tomography, whereby distances to points of the surface are measured based on interferograms and classifying of measurements as non-valid or valid based on evaluation of phase change or amplitude change of a respective interferogram.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.