Measurement apparatus of wavefront and polarization profile of vectorial optical fields

US11067450B2 · kind B2 · utility

Assignee

• University of South Florida · US

Inventors

• Zhimin Shi · Bellevue, US
• Darrick Hay · Brandon, US
• Ziyi Zhu · Pidley, GB
• Yiyu Zhou · Rochester, US
• Robert W. Boyd · Melbourne, US

Key dates

• Filing date: May 6, 2019
• Grant date: Jul 20, 2021
• Expiry date: Jun 4, 2039

Classification

• Technology area (CPC G): Physics
• CPC primary: G01J2009/0265
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An apparatus measures the transverse profile of vectorial optical field beams, including both the phase and the polarization spatial profile. The apparatus contains a polarization separation module, a weak perturbation module, and a detection module. Characterizing the transverse profile of vector fields provides an optical metrology tool for both fundamental studies of vectorial optical fields and a wide spectrum of applications, including microscopy, surveillance, imaging, communication, material processing, and laser trapping.