Patent · US Active

Test system and method of operating the same

US11067623B2 · kind B2 · utility

1Cited by

2References

10Claims

0Family size

Assignee

Test Research, Inc. · TW

Inventors

Ming-Hsien Liu · New Taipei, TW
Hsin-Wei Huang · New Taipei, TW

Key dates

Filing date	May 19, 2019
Grant date	Jul 20, 2021
Priority date	—
Expiry date	Jul 17, 2039

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/50
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A test system includes a plurality of test core devices and a plurality of first buses. The plurality of test core devices are electrically connected to a device under test (DUT). The plurality of first buses are electrically connected to the test core devices, where at least one set of test core devices selected from the plurality of test core devices are merged to be a merged test core device through one or more of the plurality of first buses.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.