Inspection systems and methods including image classification module
US11068752B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 31, 2019 |
| Grant date | Jul 20, 2021 |
| Priority date | — |
| Expiry date | Mar 23, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/82
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of inspecting a component using an image inspection controller that includes a processor communicatively coupled to a memory includes classifying each sample image in a first database as a first sample or a second sample using a classification module, extracting at least one class generic feature from each first sample to generate a plurality of class generic features, and extracting at least one class specific feature from each second sample to generate a plurality of class specific features. The method further includes combining the class generic features and the class specific features to generate a plurality of supplemental images. The method further includes storing the sample images and the supplemental images in a second database, classifying each sample image and each supplemental image, capturing at least one image of the component using a camera, and identifying at least one feature of the component in the at least one image of the component using the classification module.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.