Patent · US Active

Inventory management system with statistical learning

US11068844B2 · kind B2 · utility

1Cited by
4References
11Claims
0Family size

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Key dates

Filing dateApr 17, 2019
Grant dateJul 20, 2021
Priority date
Expiry dateMay 15, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06K7/10475
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Response parameters for a population of RFID tags present in an inventory space are determined by (a) continuously scanning the inventory space to interrogate the population of RFID tags and receiving responses from RFID tags within the population; (b) after multiple responses have been received from a specific RFID tag, determining response times for the specific RFID tag corresponding to time periods between sequential ones of the multiple responses from the specific RFID tag, (c) calculating a maximum acceptable response time based at least in part on the response times determined in step (b); and (c) recording a response interval data set including one or more of the response times determined in step (b) and the maximum acceptable response time calculated in step (c).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.