OCT measurement device with back-reflection
US11073370B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 6, 2019 |
| Grant date | Jul 27, 2021 |
| Priority date | — |
| Expiry date | Sep 12, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B2290/65
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical system comprising an optical coherence tomography (OCT) measuring device and a beam deflection unit for laterally deflecting the position or angle of a beam path of the OCT measuring device.There is an optical component in the beam path, said optical component being embodied in such a way that a back-reflection of the optical component has a different configuration in terms of its longitudinal location along the beam path depending on the lateral position of the deflected beam path on the optical component.The optical system comprises an evaluation unit which is embodied in such a way that a value of the lateral position or angle deflection of the beam deflection unit is determinable on the basis of a longitudinal location of the back-reflection at the optical component determined by the OCT measuring device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.