Wavefront sensor and method of reconstructing distorted wavefronts

US11073427B2 · kind B2 · utility

Assignee

• King Abdullah University of Science and Technology · SA

Inventors

• Congli Wang · Thuwal, SA
• Xiong Dun · Thuwal, SA
• Qiang Fu · Beijing, CN
• Wolfgang Heidrich · Vancouver, CA

Key dates

• Filing date: Oct 26, 2017
• Grant date: Jul 27, 2021
• Expiry date: Jan 17, 2038

Classification

• Technology area (CPC G): Physics
• CPC primary: G01J2009/002
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A wavefront sensor includes a mask and a sensor utilized to capture a diffraction pattern generated by light incident to the mask. A reference image is captured in response to a plane wavefront incident on the mask, and another measurement image is captured in response to a distorted wavefront incident on the mask. The distorted wavefront is reconstructed based on differences between the reference image and the measurement image.