Patent · US Active

Low pin count reversible scan architecture

US11073556B2 · kind B2 · utility

4Cited by
3References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 23, 2020
Grant dateJul 27, 2021
Priority date
Expiry dateApr 23, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F2119/12
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A circuit comprises a plurality of scan chains configured to perform scan shifting in two opposite directions and a register configured to store a first signal. The first signal determines whether the plurality of scan chains operate in a first mode or a second mode. The plurality of scan chains operating in the first mode is configured to perform, based on a second signal, either scan shifting in a first direction in the two opposite directions or scan capturing during a test; the plurality of scan chains operating in the second mode is configured to perform, based on the second signal, scan shifting in the first direction or a second direction in the two opposite directions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.