Detecting problematic voltage signals from charge pumps
US11073570B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | May 28, 2020 |
| Grant date | Jul 27, 2021 |
| Priority date | — |
| Expiry date | May 28, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/40
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Techniques and apparatuses are provided for testing a charge pump. A test circuit detects voltage drop-offs in a voltage signal provided by a charge pump in a test period. A comparator is used to compare the voltage signal to a divided down, delayed version of the signal. A counting circuit is connected to an output of the comparator to determine a number of the drop-offs in the test period. A control circuit such as an on-chip state machine compares the number of drop-offs to a maximum allowable number of drop-offs to set a pass/fail status of the charge pump. The control circuit can configure various parameters of the test, including a ratio of a voltage divider, and the maximum allowable number of drop-offs based on the charge pump being tested.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.