Selection of pick values for automated near surface analysis
US11073631B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 17, 2019 |
| Grant date | Jul 27, 2021 |
| Priority date | — |
| Expiry date | Jun 17, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V2210/322
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A surface-consistent refraction analysis automatically derives near surface corrections during seismic data processing. Residual time lags are evaluated in multiple CMP-offset-azimuth bins by similarity analysis with a pilot trace where a correlation window is centered at the refracted arrival. The similarity analysis may take the form of computerized cross-correlation, or other criteria such as semblance. The residuals are then used to build a system of linear equations that is simultaneously inverted for surface-consistent shot and receiver time shift corrections plus a possible subsurface residual term. The refraction analysis steps are completely automated and require a fraction of the time needed for conventional near surface analysis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.