Compensated spectroscopy measurements
US11073635B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 14, 2019 |
| Grant date | Jul 27, 2021 |
| Priority date | — |
| Expiry date | Sep 19, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V5/104
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Elemental concentrations in subterranean formations may be determined using neutron spectroscopy. For example, neutrons may be emitted by a downhole tool into the formation and produce gamma rays via inelastic scattering of fast neutrons or capture of slow neutrons. The borehole surrounding a downhole tool may introduce artifacts in the neutron spectroscopy measurement. Embodiments of the present disclosure are directed to techniques that reduce artifacts signals in downhole tools that include one or multiple detectors based at least in part on the inelastic and capture measurements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.