Patent · US Active

Predicting failure of a magnetic tape head element

US11074121B2 · kind B2 · utility

0Cited by

12References

14Claims

0Family size

Assignee

International Business Machines Corporation · US

Inventors

Marcus Breuer · Oppenheim, DE
Frank Krick · Ockenheim, DE
Tim Oswald · Gimbsheim, DE
Bernd Freitag · Partenheim, DE

Key dates

Filing date	Mar 20, 2019
Grant date	Jul 27, 2021
Priority date	—
Expiry date	Jul 18, 2039

Classification

Technology area (CPC G)Physics
CPC primaryG11B5/5534
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A method, computer system, and computer program product for determining head wear of magnetic tape head elements of tape drives during operation. The method may include receiving a first calibration parameter for a first tape head element at a first time. Calibration parameter for the first tape head element may be compared with a reference parameter. Determination may be made whether to remove the first tape head element from service or generate a warning, based on a result of the comparison. Method may include generating the first calibration parameter by calculating midpoint bias voltage for the first tape head element as a function of bias current and head resistance. The first calibration parameter for the first tape head element may be bias current parameter or bias resistance parameter. The first calibration parameter for the first tape head element may be less than, equal to, or greater than the reference parameter.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.