Method and system for generating unit tests using machine learning
US11074163B2 · kind B2 · utility
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18References
14Claims
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Key dates
| Filing date | Nov 5, 2019 |
| Grant date | Jul 27, 2021 |
| Priority date | — |
| Expiry date | Nov 5, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N20/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for generating a new test for a set of software code is provided. The method includes accessing a plurality of existing unit tests; implementing a machine learning algorithm; determining intended objectives of the set of software code; selecting a subset of the plurality of existing unit tests based on the determined objectives and an output of the machine learning algorithm; and using the selected unit tests to automatically generate the new test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.