Patent · US Revoked

Hybrid overlay target design for imaging-based overlay and scatterometry-based overlay

US11079335B2 · kind B2 · utility

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Inventor

Key dates

Filing dateJun 1, 2018
Grant dateAug 3, 2021
Priority date
Expiry dateApr 9, 2039

Classification

  • Technology area (CPC —)General

Abstract

Designs for a hybrid overlay target design that includes a target area with both an imaging-based target and a scatterometry-based target are disclosed. The imaging-based overlay target design can include side-by-side grating structure. A scatterometry-based overlay target design at a different location in the target area can include grating-over-grating structure. A method of measuring the hybrid overlay target design and a system with both an imaging optical system and a scatterometry system for measuring the hybrid overlay target design are also disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.