Test jig for testing electrical characteristics of semiconductor product
US11079426B2 · kind B2 · utility
0Cited by
1References
7Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Mar 1, 2019 |
| Grant date | Aug 3, 2021 |
| Priority date | — |
| Expiry date | Aug 9, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2887
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test jig for testing electrical characteristics of a semiconductor product includes a conductive ground block for supporting the semiconductor product thereon; a substrate provided on the ground block, and having a first and a second substrate electrodes formed on the substrate for the respective electrodes to be in contact with leads of the semiconductor; and lead pressers for pressing the leads against the first and the second substrate electrodes, respectively, so that electrical connection is established between the respective leads and the first and the second substrate electrodes in testing the semiconductor product.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.