Patent · US Active

Integrated photonics source and detector of entangled photons

US11079542B2 · kind B2 · utility

6Cited by
29References
20Claims
0Family size

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Key dates

Filing dateFeb 27, 2020
Grant dateAug 3, 2021
Priority date
Expiry dateFeb 27, 2040

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04B10/70
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

Systems and methods for an integrated photon source and detector of entangled photons are provided. In certain embodiments, a system includes a first waveguide layer comprising a photon producing waveguide configured to provide two photons propagating in orthogonal modes of a single waveguide. The system also includes a second waveguide layer comprising a photon conditioning waveguide network, the second waveguide layer formed on the first waveguide layer, the second waveguide layer having a different index of refraction. Further, the system includes a photon vertical coupling waveguide, coupling the photons into the photon conditioning waveguide network, wherein the photon conditioning waveguide network converts the photons to propagate in two different waveguides in the same mode, wherein the photon conditioning waveguide network provides the photons as an output to an external device, wherein the photon conditioning waveguide network receives the photons from the external device and provides the photons to an interferometer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.