Method and device for predicting operation parameter of integrated circuit
US11080445B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 14, 2020 |
| Grant date | Aug 3, 2021 |
| Priority date | — |
| Expiry date | Jan 14, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/367
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for predicting an operation parameter of an integrated circuit includes the following steps. A plurality of cells used by the integrated circuit are provided. A voltage-frequency sweep test is performed on each of cells through a test model to generate a plurality of parameters, wherein the parameters correspond to a voltage value. A lookup table is established according to the parameters. A timing signoff corresponding to the integrated circuit is obtained. A timing analysis is performed on a plurality of timing paths of the integrated circuit according to the timing signoff and the parameters of the lookup table to obtain a critical timing path, and the operation parameter of the integrated circuit is predicted according to the critical timing path.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.