Automatic optical inspection device based on CPU+GPU+FPGA architecture

US11080840B2 · kind B2 · utility

Assignee

• Wuhan Jingce Electronic Group Co., LTD · CN

Inventors

• Yafei SHEN · Hubei, CN
• Changdong Ou · 红钢城街道, CN
• Biaohua Deng · Hubei, CN
• Zhou Wang · Aachen, DE
• Linhai Mei · 红钢城街道, CN
• Wenzhong Dong · 红钢城街道, CN
• Wentian Tang · Nanhu, CN
• Bo Li · 东风镇, CN

Key dates

• Filing date: Apr 30, 2020
• Grant date: Aug 3, 2021
• Expiry date: Apr 30, 2040

Classification

• Technology area (CPC G): Physics
• CPC primary: G06T2207/30168
• WIPO field: Computer technology
• WIPO sector: Electrical engineering

Abstract

An automatic optical inspection device, including an image storage unit; an image computing unit; and an image acquisition unit. The image storage unit includes a first communication interface and a second communication interface. The image computing unit includes a first optical interface, a second optical interface, a third optical interface, and a fourth optical interface; the image acquisition unit includes a third communication interface and a camera interface. The image storage unit is configured to transmit configuration parameters and test commands to the image computing unit, receive a test result transmitted from the image computing unit via the first communication interface, and receive data from the image acquisition unit via the second communication interface. The image computing unit is configured to receive the configuration parameters and test commands from the image storage unit, and transmit the test result to the image storage unit via the first fiber interface.