Non-contact tomographic imaging and thin film sensors for sensing permittivity changes
US11083393B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 6, 2018 |
| Grant date | Aug 10, 2021 |
| Priority date | — |
| Expiry date | Aug 12, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/226
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods for monitoring a change to a region of interest over time are disclosed. Exemplary embodiments may: (a) apply one or more layers of a stress-sensitive material to an object of interest; (b) incorporate the object of interest into a region of interest; (c) insert the region of interest with stress-sensitive material into an electrical capacitance tomography (ECT) device to interrogate the region of interest; (d) generate a first map of the region of interest based on captured information from the ECT device; (e) after a first length of time, repeat steps (c)-(d) to generate a second map of the region of interest; and (f) compare the first map to the second map to determine changes to the region of interest based on changes to the stress-sensitive material.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.