Test structure for additive manufacture and related method for emitter alignment
US11084272B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 31, 2017 |
| Grant date | Aug 10, 2021 |
| Priority date | — |
| Expiry date | Jan 7, 2040 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02P10/25
- WIPO fieldMaterials, metallurgy
- WIPO sectorChemistry
Abstract
Embodiments of the disclosure provide a test structure for additive manufacture and related methods for emitter alignment. A test structure according to the disclosure can include: a body having a reference surface, wherein the body is formed with a first beam scanner of the AM system; and a plurality of calibration features defined on the reference surface of the body, wherein each of the plurality of calibration features includes an alignment surface positioned at an offset distance relative to the reference surface, and wherein each of the plurality of calibration features is formed with a second beam scanner of the AM system different than the first beam scanner.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.