Infrared temperature-measurement probe

US11085829B2 · kind B2 · utility

Assignee

• University of Electronic Science and Technology of China · CN

Inventors

• Chao Wang · Tainan, TW
• Yang Yang · Shanghai, CN
• Jing Jiang · Beijing, CN
• Chengui Zhang · Chengdu, CN
• Zezhan Zhang · Sichuan, CN
• Fei Wang · Hangzhou City, CN
• Ying Duan · San Diego, US
• Jun Hu · 林湖乡, CN
• Yueming Wang · Hangzhou City, CN
• Hongchuan Jiang · Chengdu, CN
• Huiyuan Geng · Chengdu, CN
• Jiexiong Ding · Chengdu, CN
• Li Du · Broomfield, US

Key dates

• Filing date: Apr 10, 2018
• Grant date: Aug 10, 2021
• Expiry date: Apr 24, 2039

Classification

• Technology area (CPC G): Physics
• CPC primary: G01J5/061
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An infrared temperature-measurement probe, including: a probe housing; a reflector; and a reflector adjusting mechanism. The probe housing includes an inner wall, an outer wall, a cooling channel sandwiched between the inner wall and the outer wall, a chamber surrounded by the inner wall, and a light transmission hole communicating with the chamber. The reflector includes a mirror and a mirror frame. The reflector adjusting mechanism includes a motion controller, a drive coupling, and three control rods. The reflector and the three control rods are disposed in the chamber of the probe housing. The motion controller is disposed outside the chamber of the probe housing. The drive coupling is disposed between the motion controller and the three control rods, and the motion controller is adapted to move each of the three control rods via the drive coupling. The mirror is imbedded in and is supported by the mirror frame.