Patent · US Active

Multielement method and device for testing parts with ultrasound

US11085900B2 · kind B2 · utility

2Cited by
5References
11Claims
0Family size

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Key dates

Filing dateJan 23, 2018
Grant dateAug 10, 2021
Priority date
Expiry dateAug 21, 2038

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2291/269
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for nondestructively testing a part comprising an elongate microstructure is disclosed. The method comprises: moving a linear transducer to a plurality of positions located facing a surface of the part, the linear transducer comprising a plurality of transducer elements that are aligned along a main direction; emitting a plurality of elementary ultrasonic beams, each of the plurality of elementary ultrasonic beams being emitted by each of the plurality of transducer elements in the direction of the surface; measuring a plurality of echo signals and a plurality of structural noises, each of the plurality of echo signals and each of the plurality of structural noises being measured by each of the plurality of transducer elements, each of the echo signals resulting from the backscatter of the elementary ultrasonic beams by a defect under the surface of the part, and each of the structural noises resulting from the backscatter of the elementary ultrasonic beams by the elongate microstructure; and determining a direction of elongation of the elongate microstructure when an amplitude of one among the plurality of measured structural noises is minimal in the plurality of position…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.