Patent · US Active

Multi-focal structured illumination microscopy systems and methods

US11086113B2 · kind B2 · utility

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6References
10Claims
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Key dates

Filing dateJun 6, 2018
Grant dateAug 10, 2021
Priority date
Expiry dateJun 6, 2038

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B2207/113
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Various embodiments (300, 400, 500) for a multi-focal selective illumination microscopy (SIM) system for generating multi-focal patterns of a sample are disclosed. The embodiments (300, 400, 500) of the multi-focal SIM system perform a focusing, scaling and summing operation on each generated multi-focal pattern in a sequence of multi-focal patterns that completely scan the sample to produce a high resolution composite image.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.