Patent · US Active

Inspection system and method of inspecting a display cell using the same

US11087653B2 · kind B2 · utility

1Cited by
1References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 25, 2019
Grant dateAug 10, 2021
Priority date
Expiry dateJan 3, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG09G2330/045
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

An inspection system for a display cell having a display part and a plurality of data lines connected to first and second pixel units of the display part. An array test part and a lighting test part are located in a peripheral area around the display part. An inspection apparatus is configured to provide the array test part with an array control signal to block an array data signal from being applied to a plurality of data lines in a period in which a white image is displayed and to provide the lighting test part with a lighting control signal to block a lighting data signal from being applied to a plurality of data lines during a period in which a black image is displayed, during a drive reliability test mode for displaying a test image including the black image and the white image.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.