Patent · US Active

Inspection apparatus for optically inspecting an object, production facility equipped with the inspection apparatus, and method for optically inspecting the object using the inspection apparatus

US11090812B2 · kind B2 · utility

0Cited by
2References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 28, 2018
Grant dateAug 17, 2021
Priority date
Expiry dateFeb 28, 2038

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2021/8887
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An inspection apparatus for optically inspecting an object, including a camera device is provided. The camera device has a focal plane that includes a focusing region and is designed for taking an image of the focusing region. The inspection apparatus further includes a handling device for gripping and/or picking up the object, and a control device for controlling the handling device. The control device is designed for controlling the handling device to position the object in the focusing region. The control device includes a model of the object; the control device being designed for controlling the handling device to position the object O in the focusing region on the basis of the model.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.